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Jens Uhlig. Portrait.

Jens Uhlig

Senior lecturer

Jens Uhlig. Portrait.

Beamline test of a transition-edge-sensor spectrometer in preparation for kaonic-atom measurements

Author

  • T. Hashimoto
  • Mohamad Bazzi
  • D A Bennett
  • C. Berucci
  • D. Bosnar
  • C. Curceanu
  • W B Doriese
  • J W Fowler
  • H Fujioka
  • C. Guaraldo
  • F Parnefjord Gustafsson
  • R. Hayakawa
  • R. S. Hayano
  • J. P. Hays-Wehle
  • G C Hilton
  • T. Hiraiwa
  • Y. Ichinohe
  • M. Iio
  • M. Iliescu
  • S. Ishimoto
  • Y. Ishisaki
  • K Itahashi
  • M. Iwasaki
  • Y. Ma
  • H. Noda
  • H. Noumi
  • G. C. O'Neil
  • H Ohnishi
  • S. Okada
  • H. Outa
  • K. Piscicchia
  • C D Reintsema
  • Y. Sada
  • F. Sakuma
  • Miyuki Sato
  • D. R. Schmidt
  • A. Scordo
  • M Sekimoto
  • Hongqi Shi
  • D. Sirghi
  • F. Sirghi
  • K. Suzuki
  • D S Swetz
  • K. Tanida
  • H. Tatsuno
  • M. Tokuda
  • J. Uhlig
  • J N Ullom
  • S. Yamada
  • T. Yamazaki
  • J. Zmeskal

Summary, in English

We are developing a new technique to apply transition-edge sensors (TESs) to X-ray spectroscopy of exotic atoms, especially of kaonic atoms. To demonstrate the feasibility of this pioneering project, performance of a TES-based X-ray detector was evaluated in pion- and kaon-beam environments at particle accelerators.We successfully observed X-rays from pionic-carbon atoms with a resolution as good as 7 eV FWHM at 6 keV. Also at a kaon beamline, we confirmed that the TES spectrometer will be able to achieve our resolution goal, 6 eV, in our first scientific campaign to measure X-rays from kaonic-helium atoms.

Department/s

  • Chemical Physics

Publishing year

2017-06-01

Language

English

Publication/Series

IEEE Transactions on Applied Superconductivity

Volume

27

Issue

4

Document type

Journal article

Publisher

IEEE - Institute of Electrical and Electronics Engineers Inc.

Topic

  • Subatomic Physics

Keywords

  • Nuclear physics
  • Particle beams
  • Superconducting photodetectors
  • X-ray detectors

Status

Published

ISBN/ISSN/Other

  • ISSN: 1051-8223