X-ray Spectrometer

Summary, in English

An x-ray spectrometer includes: an x-ray plasma source that produces first x-rays; an x-ray optic in optical communication with the x-ray plasma source and that: receives the first x-rays from the x-ray plasma source; focuses the first x-rays to produce second x-rays; and communicates the second x-rays to a sample that produces product x-rays in response to receipt of the second x-rays and second light; and a microcalorimeter array detector in optical communication with the sample and that receives the product x-rays from the sample.

• Other contributions: J N Ullom; Galen O'Neil; Luis Miaja Avila; Kevin Silverman; Daniel S. Swetz; Ralph Jimenez; W B Doriese; Gene C. Hilton; Carl D. Reintsema; Daniel Schmidt; Bradley K. Alpert; Jens Uhlig; Young Il Joe; Wilfred Fullagar; Villy Sundström; Ilari J. Maasilta; Joseph W. Fowler
• Department/s: Chemical Physics; NanoLund: Centre for Nanoscience
• Publishing year: 2019-02-28
• Language: English
• Links: http://www.freepatentsonline.com/20190064084.pdf
• Document type: Patent
• Publisher: United States Patent Application Publication
• Topic: Subatomic Physics
• Status: Published